-
E1
-
Group Tolan
-
Research
-
DELTA Beamline 9
Publications BL9
Volmer, R. A. Secco, J. S. Tse, and M. Tolan, X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46, Phys. Rev. B 72, 035104 (2005). M. Paulus, R. Fendt, C. Sternemann [...] B. Bergmann and B. Breidenstein, Physical-Vapor-Deposition-Coated Natural Rocks as Sustainable Cutting Material: First Insights into the Effect of Substrate Integrity on Properties of TiN Thin Film, Coatings [...] Wilke, and M. Tolan, Bulk sensitive determination of the Fe3+/Fetot-ratio in minerals by Fe L2/3-edge x-ray Raman scattering spectroscopy at ambient and high pressure, J. Anal. At. Spectrom. 31, 815 (2016) …